{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T07:57:43Z","timestamp":1725609463928},"reference-count":11,"publisher":"IEEE Comput. Soc","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/hldvt.2003.1252481","type":"proceedings-article","created":{"date-parts":[[2004,3,30]],"date-time":"2004-03-30T22:17:26Z","timestamp":1080685046000},"page":"96-101","source":"Crossref","is-referenced-by-count":7,"title":["Enhancing the control and efficiency of the covering process [logic verification]"],"prefix":"10.1109","author":[{"given":"S.","family":"Fine","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Ziv","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1145\/775832.775907","article-title":"Coverage directed test generation for functional verification using Bayesian networks","author":"fine","year":"2003","journal-title":"Proceedings of the 40th Design Automation Conference"},{"year":"1973","author":"duda","journal-title":"Pattern Classification and Scene Analysis","key":"ref3"},{"year":"1988","author":"pearl","journal-title":"Probabilistic Reasoning in Intelligent Systems Network of Plausible Inference","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/DATE.2001.915057"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.3115\/981574.981598"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/DATE.1999.761162"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1145\/331499.331504"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-387-21606-5","author":"hastie","year":"2001","journal-title":"The Elements of Statistical Learning"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1002\/0471200611"},{"key":"ref9","doi-asserted-by":"crossref","DOI":"10.1109\/DAC.2002.1012733","article-title":"Hole analysis for functional coverage data","author":"lachish","year":"2002","journal-title":"Proceedings of the 39th Design Automation Conference"},{"year":"2000","author":"bergeron","journal-title":"Writing Testbenches Functional Verification of HDL Models","key":"ref1"}],"event":{"acronym":"HLDVT-03","name":"Eighth IEEE International High-Level Design Validation and Test Workshop","location":"San Francisco, CA, USA"},"container-title":["Eighth IEEE International High-Level Design Validation and Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8873\/28031\/01252481.pdf?arnumber=1252481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,15]],"date-time":"2021-06-15T09:37:13Z","timestamp":1623749833000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1252481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/hldvt.2003.1252481","relation":{},"subject":[]}}