{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T15:43:34Z","timestamp":1742399014105,"version":"3.35.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/hldvt.2007.4392792","type":"proceedings-article","created":{"date-parts":[[2008,7,21]],"date-time":"2008-07-21T21:16:34Z","timestamp":1216674994000},"page":"83-90","source":"Crossref","is-referenced-by-count":20,"title":["Model-driven test generation for system level validation"],"prefix":"10.1109","author":[{"given":"Deepak A.","family":"Mathaikutty","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sumit Ahuja","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ajit Dingankar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sandeep Shukla","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Model-driven validation of SystemC designs","author":"patel","year":"2007","journal-title":"proceedings of the conference on Design Automation Conference (DAC)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.112"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"425","DOI":"10.7551\/mitpress\/5641.003.0021","article-title":"The foundations of ESTEREL","author":"berry","year":"2000","journal-title":"Proof Language and Interaction Essays in Honour of Robin Milner"},{"year":"0","key":"ref13","article-title":"Esterel Studio"},{"year":"0","key":"ref14","article-title":"SystemC Website"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1109118.1109120"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364687"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1145\/309847.309909","article-title":"Micro architecture coverage directed generation of test programs","author":"ur","year":"1999","journal-title":"Proceedings ACM\/IEEE Design Automation Conference (DAC)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2000.886883"},{"key":"ref5","article-title":"A Probabilistic Analysis For Fault Detectability of Code Coverage Metrics","author":"kodakara","year":"2006","journal-title":"proceedings of the 7th International Workshop on Microprocessor Test and Verification (MTV)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253710"},{"year":"0","key":"ref7","article-title":"Specman Elite"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.162"},{"key":"ref1","article-title":"A study in coverage driven test generation","author":"benjamin","year":"1999","journal-title":"Proc 36th Conf Design Automation (DAC)"},{"year":"0","key":"ref9","article-title":"Property Specification Language"}],"event":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","start":{"date-parts":[[2007,11,7]]},"location":"Irvine, CA, USA","end":{"date-parts":[[2007,11,9]]}},"container-title":["2007 IEEE International High Level Design Validation and Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4392771\/4392772\/04392792.pdf?arnumber=4392792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,31]],"date-time":"2025-01-31T03:36:37Z","timestamp":1738294597000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4392792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/hldvt.2007.4392792","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}