{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T18:27:26Z","timestamp":1725388046388},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,11]]},"DOI":"10.1109\/hldvt.2008.4695899","type":"proceedings-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T11:43:50Z","timestamp":1228909430000},"page":"177-184","source":"Crossref","is-referenced-by-count":9,"title":["Injecting intermittent faults for the dependability validation of commercial microcontrollers"],"prefix":"10.1109","author":[{"given":"D.","family":"Gil","sequence":"first","affiliation":[]},{"given":"L.J.","family":"Saiz","sequence":"additional","affiliation":[]},{"given":"J.","family":"Gracia","sequence":"additional","affiliation":[]},{"given":"J.C.","family":"Baraza","sequence":"additional","affiliation":[]},{"given":"P.J.","family":"Gil","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-7091-9170-5_1"},{"year":"0","key":"17"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1016\/S1383-7621(01)00036-4"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"},{"key":"16","first-page":"176","author":"mcpherson","year":"2006","journal-title":"Reliability Challenges for 45nm and Deyond"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538761"},{"key":"14","first-page":"67","article-title":"applying fault injection to study the effects of intermittent faults","author":"saiz","year":"2008","journal-title":"7th European Dependable Computing Conference (EDCC-7) Supplemental Volume"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/32.44380"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1007\/0-306-48711-X_10"},{"journal-title":"Failure Mechanisms in Semiconductor Devices","year":"1997","author":"amerasekera","key":"3"},{"key":"2","article-title":"impact of intermittent faults on nanocomputing devices","author":"constantinescu","year":"2007","journal-title":"Procs WDSN-07"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028901"},{"key":"10","article-title":"detecting emerging wearout faults","author":"smolens","year":"2007","journal-title":"3rd Workshop on Silicon Errors in Logic - System Effects (SELSE3)"},{"journal-title":"CMOS VLSI Design","year":"2005","author":"weste","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1002\/0471728527"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2003.1249470"},{"key":"4","article-title":"fault representativeness","author":"gil","year":"2002","journal-title":"Deliverable ETIE2 of Dependability Benchmarking Project IST-2000-25245"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2005.1408423"},{"journal-title":"Reliable Computer Systems Design and Evaluation (2nd Edition)","year":"1992","author":"siewiorek","key":"8"}],"event":{"name":"2008 IEEE International High Level Design Validation and Test Workshop (HLDVT)","start":{"date-parts":[[2008,11,19]]},"location":"Incline Village, NV, USA","end":{"date-parts":[[2008,11,21]]}},"container-title":["2008 IEEE International High Level Design Validation and Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4690895\/4695856\/04695899.pdf?arnumber=4695899","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T14:18:27Z","timestamp":1489760307000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4695899\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,11]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/hldvt.2008.4695899","relation":{},"subject":[],"published":{"date-parts":[[2008,11]]}}}