{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T00:07:52Z","timestamp":1725581272558},"reference-count":3,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/hldvt.2010.5496649","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T18:06:27Z","timestamp":1278439587000},"page":"138-141","source":"Crossref","is-referenced-by-count":4,"title":["The relationship of code coverage metrics on high-level and RTL code"],"prefix":"10.1109","author":[{"given":"John","family":"Sanguinetti","sequence":"first","affiliation":[]},{"given":"Eugene","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"2010","key":"ref3"},{"journal-title":"Cynthesizer User Guide","article-title":"Forte Design Systems","year":"2010","key":"ref2"},{"journal-title":"SystemC From the Ground Up","year":"2006","author":"black","key":"ref1"}],"event":{"name":"2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)","start":{"date-parts":[[2010,6,10]]},"location":"Anaheim, FL, USA","end":{"date-parts":[[2010,6,12]]}},"container-title":["2010 IEEE International High Level Design Validation and Test Workshop (HLDVT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5488975\/5496643\/05496649.pdf?arnumber=5496649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T23:32:35Z","timestamp":1489879955000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5496649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":3,"URL":"https:\/\/doi.org\/10.1109\/hldvt.2010.5496649","relation":{},"subject":[],"published":{"date-parts":[[2010,6]]}}}