{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T14:08:39Z","timestamp":1773410919492,"version":"3.50.1"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,11]]},"DOI":"10.1109\/hldvt.2011.6113982","type":"proceedings-article","created":{"date-parts":[[2012,1,6]],"date-time":"2012-01-06T14:31:55Z","timestamp":1325860315000},"page":"92-97","source":"Crossref","is-referenced-by-count":9,"title":["Post-silicon code coverage evaluation with reduced area overhead for functional verification of SoC"],"prefix":"10.1109","author":[{"given":"Mehdi","family":"Karimibiuki","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyle","family":"Balston","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alan J.","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andre","family":"Ivanov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","author":"piziali","year":"2004","journal-title":"Functional Verification Coverage Measurement and Analysis"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2009.5340171"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837280"},{"key":"3","first-page":"60","article-title":"Reaching coverage closure in post-silicon validation","volume":"6504","author":"adir","year":"2011","journal-title":"LNCS"},{"key":"2","year":"0","journal-title":"Aeroflex Gaisler LEON3 SoC"},{"key":"1","year":"0","journal-title":"Aeroflex Gaisler IP Library"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/357062.357071"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.936381"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465061"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2007.4392804"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/174675.175935"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837278"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837279"}],"event":{"name":"2011 IEEE International High Level Design Validation and Test Workshop (HLDVT)","location":"Napa Valley, CA, USA","start":{"date-parts":[[2011,11,9]]},"end":{"date-parts":[[2011,11,11]]}},"container-title":["2011 IEEE International High Level Design Validation and Test Workshop"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6093762\/6113979\/06113982.pdf?arnumber=6113982","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T14:00:34Z","timestamp":1490104834000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6113982\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,11]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/hldvt.2011.6113982","relation":{},"subject":[],"published":{"date-parts":[[2011,11]]}}}