{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T22:50:11Z","timestamp":1768344611342,"version":"3.49.0"},"reference-count":49,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,12,7]],"date-time":"2020-12-07T00:00:00Z","timestamp":1607299200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,7]],"date-time":"2020-12-07T00:00:00Z","timestamp":1607299200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,7]],"date-time":"2020-12-07T00:00:00Z","timestamp":1607299200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004040","name":"KU Leuven","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004040","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100010002","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010002","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,12,7]]},"DOI":"10.1109\/host45689.2020.9300264","type":"proceedings-article","created":{"date-parts":[[2020,12,25]],"date-time":"2020-12-25T22:19:40Z","timestamp":1608934780000},"page":"229-240","source":"Crossref","is-referenced-by-count":19,"title":["Cryptographic Fault Diagnosis using VerFI"],"prefix":"10.1109","author":[{"given":"Victor","family":"Arribas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felix","family":"Wegener","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amir","family":"Moradi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Svetla","family":"Nikova","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"crossref","first-page":"513","DOI":"10.1007\/BFb0052259","article-title":"Differential fault analysis of secret key cryptosystems","volume":"1294","author":"biham","year":"1997","journal-title":"Advances in Cryptology - CRYPTO ‘97 17th Annual International Cryptology Conference"},{"key":"ref38","first-page":"37","article-title":"On the importance of checking cryptographic protocols for faults (extended abstract)","volume":"1233","author":"boneh","year":"1997","journal-title":"Advances in Cryptology - EUROCRYPT ‘97 International Conference on the Theory and Application of Cryptographic Techniques"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2231707"},{"key":"ref32","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","article-title":"The sorcerer’s apprentice guide to fault attacks","volume":"94","author":"bar-el","year":"2006","journal-title":"Proceedings of the IEEE"},{"key":"ref31","author":"otto","year":"2005","journal-title":"Fault Attacks and Countermeasures"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.17"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060206"},{"key":"ref36","first-page":"182","article-title":"Stuck-open fault diagnosis with stuck-at model","author":"fan","year":"2005","journal-title":"10th European Test Symposium ETS 2005"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2363152"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16754"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/43.124398"},{"key":"ref27","author":"bushnell","year":"2013","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref29","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/43.536711","article-title":"HOPE: an efficient parallel fault simulator for synchronous sequential circuits","volume":"15","author":"lee","year":"1996","journal-title":"IEEE Trans on CAD of Integrated Circuits and Systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-52993-5_11"},{"key":"ref1","article-title":"Test vector leakage assessment (TVLA) methodology in practice","author":"becker","year":"2013","journal-title":"International Cryptographic Module Conference"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1992.229933"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062340"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2016.2516905"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.46586\/tosc.v2019.i1.5-45"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i2.242-276"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/11935308_38"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"302","DOI":"10.1007\/978-3-662-53008-5_11","article-title":"Parti - towards combined hardware countermeasures against side-channel and fault-injection attacks","volume":"9815","author":"schneider","year":"2016","journal-title":"Advances in Cryptology - CRYPTO 2016 - 36th Annual International Cryptology Conference"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3934\/amc.2016.10.131"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-016-0138-1"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/12.869328"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24638-1_15"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/11761679_19"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"121","DOI":"10.1007\/978-3-319-96884-1_5","article-title":"CAPA: the spirit of beaver against physical attacks","volume":"10991","author":"reparaz","year":"2018","journal-title":"Advances in Cryptology - CRYPTO 2018 - 38th Annual International Cryptology Conference"},{"key":"ref15","first-page":"25","article-title":"M&M: Masks and Macs against physical attacks","volume":"2019","author":"de meyer","year":"2019","journal-title":"IACR Trans Cryptogr Hardw Embed Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.394-430"},{"key":"ref17","first-page":"203","article-title":"Impeccable circuits","volume":"2018","author":"aghaie","year":"2018","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70766"},{"key":"ref19","first-page":"368","article-title":"Multiple stuck-at fault coverage of single stuck-at fault test sets","author":"hughes","year":"1986","journal-title":"Proceedings International Test Conference 1986"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2018.8617841"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-78375-8_11"},{"key":"ref6","first-page":"562","article-title":"maskverif: a formal tool for analyzing software and hardware masked implementations","volume":"2018","author":"barthe","year":"2018","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref5","first-page":"16","article-title":"Towards efficient and automated side channel evaluations at design time","volume":"7","author":"sijacic","year":"2018","journal-title":"PROOFS 2018 7th International Workshop on Security Proofs for Embedded Systems colocated with CHES 2018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-014-0092-8"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"370","DOI":"10.1109\/JPROC.2005.862424","article-title":"The sorcerer’s apprentice guide to fault attacks","volume":"94","author":"bar-el","year":"2006","journal-title":"Proceedings of the IEEE"},{"key":"ref49","first-page":"27","article-title":"DFA on AES","volume":"3373","author":"giraud","year":"2004","journal-title":"Advanced Encryption Standard - AES 4th International Conference AES 2004"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1190590"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-48800-3_17"},{"key":"ref45","first-page":"536","article-title":"Protecting against statistical ineffective fault attacks","volume":"2019","author":"daemen","year":"2019","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref48","doi-asserted-by":"crossref","first-page":"326","DOI":"10.1007\/978-3-642-23951-9_22","article-title":"The LED block cipher","volume":"6917","author":"guo","year":"2011","journal-title":"Cryptographic Hardware and Embedded Systems - CHES 2011 - 13th International Workshop"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-32009-5_38"},{"key":"ref42","article-title":"Yosys - a free verilog synthesis suite","author":"wolf","year":"2013","journal-title":"Proceedings of AustroChip"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.547-572"},{"key":"ref44","first-page":"414","article-title":"A countermeasure against one physical cryptanalysis may benefit another attack","volume":"2288","author":"yen","year":"2001","journal-title":"Information Security and Cryptology - ICISC 2001 4th International Conference Seoul"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s10207-009-0099-9"}],"event":{"name":"2020 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","location":"San Jose, CA, USA","start":{"date-parts":[[2020,12,7]]},"end":{"date-parts":[[2020,12,11]]}},"container-title":["2020 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9300124\/9300255\/09300264.pdf?arnumber=9300264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T15:36:59Z","timestamp":1656344219000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9300264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,7]]},"references-count":49,"URL":"https:\/\/doi.org\/10.1109\/host45689.2020.9300264","relation":{},"subject":[],"published":{"date-parts":[[2020,12,7]]}}}