{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T14:33:15Z","timestamp":1784212395149,"version":"3.55.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T00:00:00Z","timestamp":1656288000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T00:00:00Z","timestamp":1656288000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,6,27]]},"DOI":"10.1109\/host54066.2022.9840109","type":"proceedings-article","created":{"date-parts":[[2022,8,9]],"date-time":"2022-08-09T16:53:39Z","timestamp":1660064019000},"page":"9-12","source":"Crossref","is-referenced-by-count":12,"title":["Security Properties Driven Pre-Silicon Laser Fault Injection Assessment"],"prefix":"10.1109","author":[{"given":"Nitin","family":"Pundir","sequence":"first","affiliation":[{"name":"University of Florida"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Henian","family":"Li","sequence":"additional","affiliation":[{"name":"University of Florida"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lang","family":"Lin","sequence":"additional","affiliation":[{"name":"Ansys, Inc."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Norman","family":"Chang","sequence":"additional","affiliation":[{"name":"Ansys, Inc."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Farimah","family":"Farahmandi","sequence":"additional","affiliation":[{"name":"University of Florida"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[{"name":"University of Florida"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.151"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532028"},{"key":"ref10","year":"0","journal-title":"RedHawk-SC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.125"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-85893-5_4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2928972"},{"key":"ref8","year":"0","journal-title":"Opencores"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2834396"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.07.037"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02106.x"},{"key":"ref9","year":"0","journal-title":"Synopsys"}],"event":{"name":"2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","location":"McLean, VA, USA","start":{"date-parts":[[2022,6,27]]},"end":{"date-parts":[[2022,6,30]]}},"container-title":["2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9839666\/9839669\/09840109.pdf?arnumber=9840109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,29]],"date-time":"2022-08-29T17:52:56Z","timestamp":1661795576000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9840109\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,6,27]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/host54066.2022.9840109","relation":{},"subject":[],"published":{"date-parts":[[2022,6,27]]}}}