{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:41:39Z","timestamp":1761648099272,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/hst.2013.6581580","type":"proceedings-article","created":{"date-parts":[[2013,8,28]],"date-time":"2013-08-28T21:14:00Z","timestamp":1377724440000},"page":"143-150","source":"Crossref","is-referenced-by-count":13,"title":["Stability analysis of a physical unclonable function based on metal resistance variations"],"prefix":"10.1109","author":[{"given":"J.","family":"Ju","sequence":"first","affiliation":[]},{"given":"R.","family":"Chakraborty","sequence":"additional","affiliation":[]},{"given":"C.","family":"Lamech","sequence":"additional","affiliation":[]},{"given":"J.","family":"Plusquellic","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"486","article-title":"Experimental Evaluation of Physically Unclonable Functions in 65 nm CMOS","author":"koeberl","year":"2012","journal-title":"IEEE European Solid-State Circuits Conference ESSCIRC 2012"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/WIFS.2012.6412622"},{"key":"10","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1137\/060651380"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1145\/2072274.2072276"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/VLSIC.2004.1346548"},{"key":"5","first-page":"92","article-title":"Managing process variation in intel's 45nm cmos technology","volume":"12","author":"kuhn","year":"2008","journal-title":"Intel Technology Journal"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1201\/b10602-14"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1007\/978-1-4419-8080-9_4"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1145\/1866307.1866335"},{"key":"11","doi-asserted-by":"crossref","first-page":"366","DOI":"10.1007\/978-3-642-15031-9_25","article-title":"The glitch PUF: A new delay-puf architecture exploiting glitch shapes","author":"suzuki","year":"2010","journal-title":"Cryptographic Hardware and Embedded Systems, CHES 2010"},{"key":"12","doi-asserted-by":"crossref","first-page":"369","DOI":"10.1007\/11894063_29","article-title":"Read-proof hardware from protective coatings","author":"tuyls","year":"2006","journal-title":"Cryptographic Hardware and Embedded Systems - CHES 2006"}],"event":{"name":"2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)","start":{"date-parts":[[2013,6,2]]},"location":"Austin, TX, USA","end":{"date-parts":[[2013,6,3]]}},"container-title":["2013 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6573517\/6581554\/06581580.pdf?arnumber=6581580","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T20:53:35Z","timestamp":1498078415000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6581580\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/hst.2013.6581580","relation":{},"subject":[],"published":{"date-parts":[[2013,6]]}}}