{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,10]],"date-time":"2024-08-10T06:32:04Z","timestamp":1723271524894},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/hst.2016.7495580","type":"proceedings-article","created":{"date-parts":[[2016,6,25]],"date-time":"2016-06-25T11:39:11Z","timestamp":1466854751000},"source":"Crossref","is-referenced-by-count":11,"title":["A novel security technique to generate truly random and highly reliable reconfigurable ROPUF-based cryptographic keys"],"prefix":"10.1109","author":[{"given":"Fathi","family":"Amsaad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Atul","family":"Prasad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chayanika","family":"Roychaudhuri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammed","family":"Niamat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2011.6132673"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272361"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9088-4"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2006.270300"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/66.554480"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1147\/rd.504.0433"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/NAECON.2014.7045838"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488960"},{"key":"ref18","first-page":"499","article-title":"Using a statistical metrology framework to identify systematic and random sources of die and wafer-Ievelild thickness variation in cmp processes","author":"stine","year":"1995","journal-title":"International Electron Devices Meeting"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513108"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/11894063_29"},{"key":"ref3","article-title":"Physical one-way functions","author":"ravikanth","year":"2001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/586110.586132"},{"key":"ref5","article-title":"Theorems on the variable-length intrinsic randomness","author":"han","year":"2000","journal-title":"IEEE Trans Information Theory"},{"key":"ref8","article-title":"FPGA intrinsic PUFs and their use for IP protection","author":"guajardo","year":"2007","journal-title":"Proc HOST"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2008.4559053"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.88"},{"key":"ref1","article-title":"Physical unclonable functions for device authentication and secret key generation’","author":"suh","year":"2007","journal-title":"Proc DAC"},{"key":"ref9","article-title":"Physical unclonable function with tristate buffers","author":"o\u00a8 ztu\u00a8rk","year":"2008","journal-title":"Proc Circuits Systems"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2013.6674686"},{"key":"ref22","article-title":"A statistical test suite for random and pseudorandom number generators for cryptographic applications","author":"rukhin","year":"2010","journal-title":"NIST Special Publication"},{"key":"ref21","article-title":"Statistics for the Behavioral Sciences","author":"krishnan","year":"0"}],"event":{"name":"2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)","location":"McLean, VA, USA","start":{"date-parts":[[2016,5,3]]},"end":{"date-parts":[[2016,5,5]]}},"container-title":["2016 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7489989\/7495545\/07495580.pdf?arnumber=7495580","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T13:03:25Z","timestamp":1475154205000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7495580\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/hst.2016.7495580","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}