{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T06:25:34Z","timestamp":1729664734400,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555377","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"41-44","source":"Crossref","is-referenced-by-count":2,"title":["Dew point measurement using a quartz crystal sensor"],"prefix":"10.1109","author":[{"given":"Jing","family":"Nie","sequence":"first","affiliation":[]},{"given":"XiaoFeng","family":"Meng","sequence":"additional","affiliation":[]},{"given":"LiJun","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Rui","family":"Zheng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2006.02.017"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(96)02020-5"},{"key":"1","doi-asserted-by":"crossref","first-page":"196","DOI":"10.1016\/S0924-4247(01)00788-9","article-title":"Recent achievements in miniaturised humidity sensors - A review of transduction techniques","volume":"96","author":"rittersma","year":"2002","journal-title":"Sensors and Actuators A Physical"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/S0003-2670(00)82721-X"},{"key":"5","first-page":"206","volume":"155","author":"sauerbrey","year":"1959","journal-title":"Verwendung von Schwingquarzen Zur Wagung Dunner Schichten und Zur Mikrowaigung"},{"journal-title":"Practical Guide of Sensors","year":"1990","author":"ichinose","key":"4"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555377.pdf?arnumber=6555377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T12:49:57Z","timestamp":1498049397000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555377","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}