{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:11:05Z","timestamp":1729638665035,"version":"3.28.0"},"reference-count":39,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555395","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"126-131","source":"Crossref","is-referenced-by-count":16,"title":["On the suitability of compressive sampling for the measurement of electrical power quality"],"prefix":"10.1109","author":[{"given":"F.","family":"Bonavolonta","sequence":"first","affiliation":[]},{"given":"M.","family":"D'Arco","sequence":"additional","affiliation":[]},{"given":"G.","family":"Ianniello","sequence":"additional","affiliation":[]},{"given":"A.","family":"Liccardo","sequence":"additional","affiliation":[]},{"given":"R. Schiano Lo","family":"Moriello","sequence":"additional","affiliation":[]},{"given":"L.","family":"Ferrigno","sequence":"additional","affiliation":[]},{"given":"M.","family":"Laracca","sequence":"additional","affiliation":[]},{"given":"G.","family":"Miele","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"An Introduction to Infinite-Dimensional Linear Systems Theory","year":"1995","author":"ruth","key":"19"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.07.016"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.07.020"},{"key":"18","article-title":"JPEG 2000: Image compression fundamentals, standards and practice","author":"taubman","year":"2001","journal-title":"Norwell MA Kluwer"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2232471"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.862083"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2182251"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.885507"},{"key":"39","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.09.007"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547165"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914731"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.873811"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2003.820486"},{"key":"38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.876540"},{"key":"12","first-page":"577","article-title":"A study on the feasibility and effectiveness of a digital filter approach for harmonic and interharmonic measurements in compliance with iec 61000-4-7","volume":"14","author":"ferrigno","year":"2007","journal-title":"Metrology and Measurement Systems International Journal"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/18.959265"},{"journal-title":"Fluke Literature Technical Data Note 2635073 D-EN-N Rev B","article-title":"Fluke 1760 three-phase power quality recorder topas","year":"2006","key":"22"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.851060"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229703"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2064350"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2209917"},{"key":"27","doi-asserted-by":"crossref","first-page":"845","DOI":"10.1109\/IMTC.2010.5488026","article-title":"GMR-based instrument for ECT on conductive planar specimens","author":"betta","year":"2010","journal-title":"Proceeding of IEEE International Instrumentation and Measurement Technology Conference-I2MTC 2010"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229455"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2176165"},{"journal-title":"Electromagnetic Compatibility - Testing and Measurement Techniques - Power Quality Measurement Methods","year":"2003","key":"3"},{"volume":"519","journal-title":"IEEE Recommended Practices and Requirements for Harmonic Control in Electrical Power Systems","year":"1992","key":"2"},{"key":"10","first-page":"3981","article-title":"Classification of power quality disturbances using wavelet and fuzzy support vector machines","author":"hu","year":"2005","journal-title":"2005 International Conference on Machine Learning and Cybernetics ICMLC 2005"},{"volume":"1159","journal-title":"IEEE Recommended practice for monitoring electric power quality","year":"1995","key":"1"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2023815"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.1998.759843"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.911701"},{"key":"32","doi-asserted-by":"crossref","first-page":"355","DOI":"10.3233\/JAE-2012-1482","article-title":"Multi-frequency eddy current testing using a GMR based instrument","volume":"39","author":"bernieri","year":"2012","journal-title":"International Journal of Applied Electromagnetics and Mechanics"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.903585"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2012.6166304"},{"journal-title":"Electromagnetic Compatibility - Testing and Measurement Techniques - General Guide on Harmonics and Interharmonics Measurements and Instrumentation for Power Supply Systems and Equipment Connected Thereto","year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2002.1022786"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/PESS.2002.1043446"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555395.pdf?arnumber=6555395","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,19]],"date-time":"2019-07-19T15:35:38Z","timestamp":1563550538000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555395\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555395","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}