{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:46:31Z","timestamp":1729662391656,"version":"3.28.0"},"reference-count":44,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555425","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"284-289","source":"Crossref","is-referenced-by-count":4,"title":["A novel biaxial probe implementing multifrequency excitation and SVM processing for NDT"],"prefix":"10.1109","author":[{"given":"Andrea","family":"Bernieri","sequence":"first","affiliation":[]},{"given":"Giovanni","family":"Betta","sequence":"additional","affiliation":[]},{"given":"Luigi","family":"Ferrigno","sequence":"additional","affiliation":[]},{"given":"Marco","family":"Laracca","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ICINFA.2010.5512024"},{"key":"35","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0053631"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1080\/10589750802687580"},{"key":"36","doi-asserted-by":"publisher","DOI":"10.1109\/19.997819"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-010-0083-3"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.01.040"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2032330"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2016890"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2010.03.007"},{"key":"39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.919011"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2009.51.6.310"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1080\/10589750802002590"},{"key":"37","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.827082"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.892525"},{"key":"38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.830588"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/j.febslet.2008.09.026"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2012.6229455"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.01.009"},{"key":"43","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2012.6166304"},{"key":"42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2161923"},{"key":"41","doi-asserted-by":"crossref","first-page":"355","DOI":"10.3233\/JAE-2012-1482","article-title":"Multi-frequency eddy current testing using a gmr based instrument","volume":"39","author":"bernieri","year":"2012","journal-title":"International Journal of Applied Electromagnetics and Mechanics"},{"key":"40","doi-asserted-by":"crossref","first-page":"845","DOI":"10.1109\/IMTC.2010.5488026","article-title":"GMR-based instrument for ECT on Conductive Planar Specimens","author":"betta","year":"2010","journal-title":"Proceeding of IEEE International Instrumentation and Measurement Technology Conference-I2MTC 2010"},{"key":"44","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2232471"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2186478"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2012.2184280"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/20.877685"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/20.996317"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.825041"},{"key":"27","first-page":"2760","article-title":"Crack Shape Reconstruction Using ECT Camera System","volume":"3","author":"y nagaya","year":"2004","journal-title":"SICE 2004 Annual Conference"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/20\/10\/105101"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.03.003"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.3901\/JME.2006.02.063"},{"key":"2","article-title":"Electromagnetic testing","volume":"4 b","author":"mcintyre","year":"1986","journal-title":"NDT Handbook"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.883095"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/0308-9126(90)91892-W"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168421"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/19.843095"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2011.2105883"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2176165"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2009.11.012"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2010.10.004"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1080\/09349840903078996"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2009.05.006"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/SFICON.2002.1159819"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555425.pdf?arnumber=6555425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,19]],"date-time":"2019-07-19T11:34:14Z","timestamp":1563536054000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555425","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}