{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:25:16Z","timestamp":1725474316842},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555433","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"323-327","source":"Crossref","is-referenced-by-count":0,"title":["Analysis of Tintoretto's paintings in the Scuola Grande di San Rocco by an image spectrometer"],"prefix":"10.1109","author":[{"given":"Pietro","family":"Fiorentin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Elena","family":"Pedrotti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Scroccaro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","article-title":"A new method for studying lighting design for works of arts","author":"fellin m","year":"2001","journal-title":"Proc of Lux Europa 2001 The 9th European Lighting Conference"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1364\/AO.37.001299"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.2307\/1506694"},{"journal-title":"Color Science Concepts and Methods Quantitative Data and Formulae","year":"2000","author":"wyszecki","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2009.5168475"},{"key":"4","article-title":"An imaging device for multispectral analysis in the visible range","author":"fiorentin","year":"2008","journal-title":"Proceedings of XVI IMEKO TC-4 Symposium"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555433.pdf?arnumber=6555433","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T00:13:14Z","timestamp":1490227994000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555433\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555433","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}