{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,8]],"date-time":"2024-08-08T23:40:32Z","timestamp":1723160432248},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555440","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"source":"Crossref","is-referenced-by-count":5,"title":["Automated wire fault location using impedance spectroscopy and Differential Evolution"],"prefix":"10.1109","author":[{"given":"Qinghai","family":"Shi","sequence":"first","affiliation":[]},{"given":"Olfa","family":"Kanoun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2004.837842"},{"key":"2","first-page":"1","article-title":"Detection and localization of cable faults by time and frequency domain measurements systems","author":"shi","year":"2010","journal-title":"8th International Multi-conference on Systems Signals & Devices"},{"key":"10","author":"haykin","year":"1988","journal-title":"Digitla Communications"},{"key":"1","first-page":"1","article-title":"Analysis of the parameters of a lossy twisted-pair cable for cable fault location","author":"shi","year":"2011","journal-title":"8th International Multi-conference on Systems Signals & Devices"},{"key":"7","author":"gonschorek","year":"2005","journal-title":"Theoretische Elektrotechnik"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/61.311215"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2005.858964"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/AUTEST.2008.4662611"},{"key":"9","author":"price","year":"2005","journal-title":"Differential Evolution A Pratical Approach to Global Optimization"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/SSD.2012.6198107"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2043720"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Minneapolis, MN, USA","start":{"date-parts":[[2013,5,6]]},"end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555440.pdf?arnumber=6555440","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T00:13:20Z","timestamp":1490228000000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555440\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555440","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}