{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T23:39:30Z","timestamp":1725406770972},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555460","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"461-464","source":"Crossref","is-referenced-by-count":0,"title":["Phase noise and transient measurement methods for V-band applications"],"prefix":"10.1109","author":[{"given":"Ya-Wen","family":"Ou","sequence":"first","affiliation":[]},{"given":"Sy-Haur","family":"Su","sequence":"additional","affiliation":[]},{"given":"Yin-Cheng","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Shuw-Guann","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Hsu-Chen","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Ying-Zong","family":"Juang","sequence":"additional","affiliation":[]},{"given":"Da-Chiang","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Hwann-Kaeo","family":"Chiou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MMW.2002.1145678"},{"key":"2","first-page":"196","article-title":"A 58-to-60.4GHz frequency synthesizer in 90nm CMOS","author":"lee","year":"2007","journal-title":"IEEE International Solid-State Circuits Conference (ISSCC)"},{"journal-title":"A New Class of Instrument Improves Your Wireless RF Design Process","year":"2005","key":"1"},{"journal-title":"Agilent PN 89400-5 Measuring Transmitter Transients with the 89400 Series Vector Signal Analyzers","year":"2000","key":"7"},{"journal-title":"Boosting PLL Design Efficiency","year":"2008","key":"6"},{"journal-title":"Agilent's Phase Noise Measurement Solutions","year":"2011","key":"5"},{"journal-title":"Advanced Phase Noise and Transient Measurement Techniques","year":"2007","key":"4"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555460.pdf?arnumber=6555460","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T04:17:25Z","timestamp":1490242645000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555460\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555460","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}