{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:58:59Z","timestamp":1729652339015,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555472","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"523-527","source":"Crossref","is-referenced-by-count":2,"title":["Cast-resin dry-type transformer partial discharge signal analysis using spectral correlated empirical mode decomposition method"],"prefix":"10.1109","author":[{"given":"Ya-Wen","family":"Tang","sequence":"first","affiliation":[]},{"given":"Ching-Chau","family":"Su","sequence":"additional","affiliation":[]},{"given":"Cheng-Chi","family":"Tai","sequence":"additional","affiliation":[]},{"given":"Jiann-Fuh","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","first-page":"903","DOI":"10.1098\/rspa.1998.0193","article-title":"The empirical mode decomposition and the Hubert spectrum for nonlinear and non-stationary time series analysis","volume":"454","author":"huang","year":"1998","journal-title":"Proceedings of The Royal Society A Mathematical Physical and Engineering Sciences"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2007.302864"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/9\/001"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2009.2013885"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2006.882107"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2037922"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.2361"},{"journal-title":"Time-Frequency Analysis Concepts and Methods","year":"2008","author":"auger","key":"9"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/21\/8\/085106"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555472.pdf?arnumber=6555472","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T12:49:46Z","timestamp":1498049386000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555472\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555472","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}