{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T13:11:45Z","timestamp":1725541905581},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555481","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"572-575","source":"Crossref","is-referenced-by-count":0,"title":["To develop an optical system model for image based multi-degree-of-freedom measurement system"],"prefix":"10.1109","author":[{"given":"Chun-Jen","family":"Chen","sequence":"first","affiliation":[]},{"given":"Chun-Li","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Wen-Tse","family":"Hsiao","sequence":"additional","affiliation":[]},{"given":"Min-Wei","family":"Hung","sequence":"additional","affiliation":[]},{"given":"Wenyuh","family":"Jywe","sequence":"additional","affiliation":[]},{"given":"Yunfeng","family":"Teng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2009.06.003"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(96)00078-8"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2008.03.128"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2009.11.006"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1115\/1.2035692"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2004.11.030"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)60619-2"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)61557-1"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1117\/1.601563"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1115\/1.2801162"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2004.12.002"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/S0141-6359(01)00105-2"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/12\/9\/316"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1305816"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1115\/1.2901643"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2007.02.004"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555481.pdf?arnumber=6555481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T04:08:10Z","timestamp":1490242090000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555481","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}