{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T10:03:14Z","timestamp":1725444194208},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555587","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"1115-1119","source":"Crossref","is-referenced-by-count":3,"title":["Efficient concurrent BIST with comparator-based response analyzer"],"prefix":"10.1109","author":[{"given":"Yang","family":"Yu","sequence":"first","affiliation":[]},{"given":"Zhiming","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Xiyuan","family":"Peng","sequence":"additional","affiliation":[]},{"given":"Dianguo","family":"Xu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.26"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.49"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-010-5167-6"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028901"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2004.842091"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2005.16"},{"key":"5","first-page":"336","article-title":"Concurrent comparative testing using bist resources","author":"saluja","year":"1987","journal-title":"Proc Int?l Conf Computer Aided Design"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2010.5446669"},{"key":"9","first-page":"1","article-title":"A concurrent BIST architecture based on monitoring square windows","author":"voyiatzis","year":"2010","journal-title":"DTIS"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/43.16803"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555587.pdf?arnumber=6555587","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T00:20:42Z","timestamp":1490228442000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555587\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555587","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}