{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:23:12Z","timestamp":1751091792950},"reference-count":52,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555592","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"1141-1146","source":"Crossref","is-referenced-by-count":6,"title":["Jitter and its relatives: A critical overview"],"prefix":"10.1109","author":[{"given":"E.","family":"Balestrieri","sequence":"first","affiliation":[]},{"given":"P.","family":"Daponte","sequence":"additional","affiliation":[]},{"given":"L.","family":"De Vito","sequence":"additional","affiliation":[]},{"given":"S.","family":"Rapuano","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"35","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387404"},{"key":"36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.04.001"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5112-8"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2008.924589"},{"journal-title":"Estimating Clock Tree Jitter","year":"2012","key":"39"},{"year":"2006","key":"37"},{"journal-title":"Intel T1 Jitter Performance Measurement - AT&T Pub 62411 Certification","year":"2001","key":"38"},{"journal-title":"Frequency Agile Jitter Measurement System","year":"2001","key":"43"},{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"0","key":"42"},{"journal-title":"Understanding the Effect of Clock Jitter on High-speed ADCs (Part 1)","year":"2008","author":"redmayne","key":"41"},{"key":"40","first-page":"48","article-title":"Reference-Clock generation for sampled data systems","author":"nunn","year":"2005","journal-title":"High Frequency Electronics"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923425"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966707"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1023\/A:1022897825759"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386939"},{"key":"26","article-title":"Estimation of the clock signal jitter using the time-interval measurement system","author":"zielinski","year":"2006","journal-title":"Proc of XVIII IMEKO World Congress Metrology for A Sustainable Development"},{"journal-title":"A Primer on Jitter Jitter Measurement and Phase-Locked Loops","year":"2012","key":"27"},{"journal-title":"Discera Understanding Jitter","year":"2012","key":"28"},{"journal-title":"SiTime Clock Jitter and Measurement","year":"2009","key":"29"},{"key":"3","article-title":"Datasheet Jitter specifications for cypress timing products","author":"martin","year":"2011","journal-title":"Cypress Semiconductor"},{"key":"2","article-title":"An eye-opening look at jitter","author":"seat","year":"2002","journal-title":"EDN"},{"journal-title":"Jitter-Understanding It Measuring It Eliminating It - Part 1","year":"2004","author":"hancock","key":"1"},{"key":"7","article-title":"When testing jitter, which results should you believe?","author":"shreier","year":"2004","journal-title":"Electronic Design"},{"journal-title":"Estimating Period Jitter from Phase Noise","year":"2006","key":"30"},{"journal-title":"Total Jitter Measurement at Low Probability Levels Using Optimized BERT Scan Method AN 5989-2933EN Agilent Technologies","year":"2007","author":"mueller","key":"6"},{"journal-title":"Jitter Basics Part 1","year":"0","author":"solorzano","key":"5"},{"journal-title":"Finding Sources of Jitter With Real-Time Jitter Analysis","year":"2008","key":"32"},{"journal-title":"Maxim High-Frequency\/Fiber Communications Group Jitter in Digital Communication Systems Part 1","year":"2001","key":"4"},{"journal-title":"Understanding Jitter Requirements of PLLBased Processors","year":"2005","key":"31"},{"journal-title":"An Introduction to Jitter in Communications Systems","year":"2003","key":"9"},{"journal-title":"Choose the Right Platform for Your Jitter Measurements","year":"2008","key":"8"},{"journal-title":"Understanding and Characterizing Timing Jitter","year":"2012","key":"19"},{"journal-title":"Converting between rms and peak-to-peak jitter at a specified BER","year":"2000","key":"17"},{"journal-title":"Understanding Data Sheet Jitter Specifications for Cypress Timing Products","year":"2005","key":"18"},{"journal-title":"Jitter and its Measurements Electronic Design","year":"2006","author":"frenzel","key":"15"},{"journal-title":"Predicting the phase noise and jitter of PLL-based frequency synthesizers","year":"2012","author":"kundert","key":"16"},{"journal-title":"Understanding Jitter and Wander Measurements and Standards","article-title":"Agilent technologies","year":"2003","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1117\/12.786883"},{"journal-title":"Measuring Jitter in Digital Systems","year":"2008","key":"11"},{"key":"12","first-page":"79","article-title":"Clock-source jitter: A clear understanding aids oscillator selection","author":"adler","year":"1999","journal-title":"Electronic Design Network Magazine"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843870"},{"key":"20","doi-asserted-by":"crossref","first-page":"502","DOI":"10.1049\/cp:20040917","article-title":"Estimation of total jitter and jitter probability density function from the signal spectrum","author":"underhill","year":"2004","journal-title":"2004 18th European Frequency and Time Forum (EFTF 2004) EFTF"},{"key":"49","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2003.1205651"},{"key":"48","first-page":"1","author":"cerda","year":"2006","journal-title":"Sources of Phase Noise and Jitter in Oscillators"},{"journal-title":"Jitter and Wander Test Solutions","year":"2005","key":"45"},{"journal-title":"ITU-T Recommendation G 810 Definitions and Terminology for Synchronization Networks","year":"1996","key":"44"},{"journal-title":"Greenray Oscillator Phase Noise Theory Vs Practicality","year":"2008","key":"47"},{"journal-title":"Managing Jitter Wander and Latency in Digital Audio Networks","year":"2005","key":"46"},{"journal-title":"Jitter - An Introduction","year":"0","key":"10"},{"key":"51","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2006.02.004"},{"journal-title":"High Frequency Electronics","first-page":"64","year":"2008","key":"52"},{"journal-title":"Hase Noise and Jitter Characterization in Oscillator Applications","year":"0","author":"fisher","key":"50"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555592.pdf?arnumber=6555592","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T16:49:53Z","timestamp":1498063793000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555592\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":52,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555592","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}