{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T22:36:05Z","timestamp":1725489365511},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555608","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"1222-1226","source":"Crossref","is-referenced-by-count":2,"title":["A digital calibration technique for cyclic ADCs using MOS capacitors"],"prefix":"10.1109","author":[{"given":"Zhiheng","family":"Wei","sequence":"first","affiliation":[]},{"given":"Shoji","family":"Kawahito","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Semiconductor Device Fundamentals","year":"1996","author":"pierret","key":"3"},{"journal-title":"Physics of Semiconductor Devices","year":"2007","author":"sze","key":"2"},{"key":"10","first-page":"1","article-title":"A 1.8V, 10-bit, 40MS\/s MOSFET-only pipeline analog-to-digital converter","author":"charkhkar","year":"2006","journal-title":"Circuits and Systems ISCAS Proc IEEE Inl Sym on"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2030635"},{"key":"7","first-page":"399","article-title":"An 80?Vrms-temporalnoise 82dB-dynamic-range CMOS image sensor with a 13-to-19b variable-resolution column-parallel folding-integration\/ cyclic ADC","author":"seo","year":"2011","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2164298"},{"key":"5","first-page":"267","article-title":"A 0.1e- vertical FPN 4.7e- read noise 71dB DR CMOS image sensor with 13b column-parallel single-ended cyclic ADCs","author":"park","year":"2009","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"journal-title":"MOS (Metal Oxide Semiconductor) Physics and Technology","year":"1982","author":"nicollian","key":"4"},{"key":"9","first-page":"1","article-title":"Desigh of high-resolution MOSFET-Only pipelined ADCs wih digital calibration","author":"aminzadeh","year":"0","journal-title":"Proc Design Automation and Test in Europe (DATE) Conf"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/4.766808"},{"key":"11","first-page":"55","article-title":"A CMOS image sensor integrating column-parallel cyclic ADCs with onchip digital error correction circuits","author":"kawahito","year":"2008","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555608.pdf?arnumber=6555608","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T04:21:03Z","timestamp":1490242863000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555608\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555608","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}