{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T03:35:39Z","timestamp":1725507339644},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555650","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"1431-1434","source":"Crossref","is-referenced-by-count":0,"title":["New method of the precise propagation delay measurement"],"prefix":"10.1109","author":[{"given":"Yi-Jiun","family":"Huang","sequence":"first","affiliation":[]},{"given":"Huang-Tien","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Chia-Shu","family":"Liao","sequence":"additional","affiliation":[]},{"given":"Wen-Hung","family":"Tseng","sequence":"additional","affiliation":[]},{"given":"Jia-Lun","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Fang-dar","family":"Chu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/58.677598"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/5.84975"},{"key":"1","doi-asserted-by":"crossref","first-page":"334","DOI":"10.1109\/FREQ.1980.200424","article-title":"accurate time and frequency transfer during common-view of a gps satellite","author":"allan","year":"1980","journal-title":"34th Annual Symposium on Frequency Control"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1966.4634"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TSET.1963.4337590"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2091313"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555650.pdf?arnumber=6555650","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T15:50:02Z","timestamp":1602690602000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6555650"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555650","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}