{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:12:12Z","timestamp":1730225532291,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555671","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"1535-1539","source":"Crossref","is-referenced-by-count":2,"title":["Adaptive window multistage median filter for image salt-and-pepper denoising"],"prefix":"10.1109","author":[{"given":"Weiyang","family":"Mu","sequence":"first","affiliation":[]},{"given":"Jing","family":"Jin","sequence":"additional","affiliation":[]},{"given":"Hongqi","family":"Feng","sequence":"additional","affiliation":[]},{"given":"Qiang","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/83.902289"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCAA.2010.5633074"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/29.1591"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IITA.2008.259"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/83.806630"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/358198.358222"},{"journal-title":"Fundamentals of nonlinear digital filtering","year":"1997","author":"astola","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-6017-0"},{"key":"9","first-page":"30","author":"zhou","year":"2007","journal-title":"The Improved Median Filter Algorithms Applied for Image Processing"},{"key":"8","first-page":"533","article-title":"A new filtering algorithm based on extremum and median value","volume":"6","author":"xing","year":"2001","journal-title":"Journal of Image and Graphics"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555671.pdf?arnumber=6555671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:00:14Z","timestamp":1602676814000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6555671"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555671","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}