{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T17:56:29Z","timestamp":1725386189185},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555673","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"1544-1549","source":"Crossref","is-referenced-by-count":1,"title":["Data compression using mixed cascade of nonlinear logic"],"prefix":"10.1109","author":[{"given":"Sunil R.","family":"Das","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Danny L.","family":"Shaw","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Satyendra N.","family":"Biswas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mansour H.","family":"Assaf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Scott","family":"Morton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Irem","family":"Ozkarahan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Emil M.","family":"Petriu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Voicu","family":"Groza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/MDT.1984.5005606"},{"year":"2000","author":"mourad","journal-title":"Principles of Testing Electronic Systems","key":"2"},{"key":"10","first-page":"12","article-title":"On the generation of test patterns for combinational circuits","author":"lee","year":"1993","journal-title":"Virginia Polytechnic Institute and State University Blacksburg VA Technical Report"},{"year":"2000","author":"rajsuman","journal-title":"System-on-a-Chip Design and Test","key":"1"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/19.982974"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/IMTC.2001.928812"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/45.127641"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/MDT.1985.294865"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TIM.2007.910004"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/TIM.2006.876523"},{"key":"11","first-page":"946","article-title":"An efficient forward fault simulation algorithm based on the parallel pattern single fault propagation","author":"lee","year":"1991","journal-title":"Proceedings of International Test Conference"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555673.pdf?arnumber=6555673","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T11:54:12Z","timestamp":1602676452000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6555673"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555673","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}