{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:12:14Z","timestamp":1730225534690,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555682","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"1590-1593","source":"Crossref","is-referenced-by-count":0,"title":["Design and development of an accelerated testing architecture for embedded systems fault monitoring"],"prefix":"10.1109","author":[{"given":"Valeria L.","family":"Scarano","sequence":"first","affiliation":[]},{"given":"Marcantonio","family":"Catelani","sequence":"additional","affiliation":[]},{"given":"Andrea","family":"Carignano","sequence":"additional","affiliation":[]},{"given":"Daniele","family":"Mazzei","sequence":"additional","affiliation":[]},{"given":"Giacomo","family":"Baldi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2006.870387"},{"key":"2","volume":"2","author":"kececioglu","year":"1991","journal-title":"Reliability and Life Testing Handbook"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-75294-3_1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2008.927847"},{"journal-title":"Electronic Materials Handbook Packaging","year":"0","author":"minges","key":"6"},{"journal-title":"Accelerated Testing Statistical Models Test Plans and Data Analysis","year":"2004","author":"nelson","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1177\/0142331208092031"},{"key":"9","first-page":"151","article-title":"Multiple-precision zero-finding methods and the complexity of elementary function evaluation","author":"brent","year":"1975","journal-title":"Analytic Computational Complexity"},{"journal-title":"Fatigue Testing and The Analysis of Results","year":"1961","author":"weibull","key":"8"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555682.pdf?arnumber=6555682","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,2,5]],"date-time":"2020-02-05T16:45:29Z","timestamp":1580921129000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6555682\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555682","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}