{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,8]],"date-time":"2025-11-08T17:38:07Z","timestamp":1762623487255,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555703","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T19:01:15Z","timestamp":1374778875000},"page":"1694-1698","source":"Crossref","is-referenced-by-count":12,"title":["Interferometric technique for scanning near-field microwave microscopy applications"],"prefix":"10.1109","author":[{"given":"H.","family":"Bakli","sequence":"first","affiliation":[]},{"given":"K.","family":"Haddadi","sequence":"additional","affiliation":[]},{"given":"T.","family":"Lasri","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2012.2218230"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2012.6259554"},{"key":"14","first-page":"185","article-title":"Near-field scanning microscopy in liquid media based on microwave interferometry","author":"haddadi","year":"2011","journal-title":"Proc 9th Int Conf on Electromagnetic Wave Interaction with Water and Moist Substances ISEMA 2011"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1063\/1.4740513"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4792381"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2009.2017352"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.862668"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-28668-6_8"},{"key":"10","first-page":"1402","article-title":"Scanning near-field microwave microscope using a rectangular waveguide probe with different resonant modes of cavity","author":"sung-nien hsieh","year":"2011","journal-title":"Asia-Pacific Microwave Conference 2011 APMC"},{"key":"7","doi-asserted-by":"crossref","first-page":"947061","DOI":"10.1063\/1.2953095","article-title":"Quantitative scanning nearfield microwave microscopy for thin film dielectric constant measurement","volume":"79","author":"karbassi","year":"2008","journal-title":"Review of Scientific Instruments"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2011.2167744"},{"key":"5","first-page":"771","article-title":"Compact near-field microwave microscope based on the multi-port technique","author":"wang","year":"2010","journal-title":"Proc Eur Microwave Conf"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2011.5973206"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/302"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/22.508246"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555703.pdf?arnumber=6555703","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T14:15:58Z","timestamp":1602684958000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6555703"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555703","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}