{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T21:42:42Z","timestamp":1725399762853},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/i2mtc.2013.6555731","type":"proceedings-article","created":{"date-parts":[[2013,7,25]],"date-time":"2013-07-25T15:01:15Z","timestamp":1374764475000},"page":"1834-1837","source":"Crossref","is-referenced-by-count":1,"title":["Automatic inspection of backlight modules by using support vector regressions"],"prefix":"10.1109","author":[{"given":"Wu-Ja","family":"Lin","sequence":"first","affiliation":[]},{"given":"Sin-Sin","family":"Jhuo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/1961189.1961199"},{"journal-title":"Statistical Learning Theory","year":"1998","author":"vapnik","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1162\/089976600300015565"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511801389"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2440-0"},{"journal-title":"Future of the Backlight Module Industry","year":"2006","author":"liao","key":"3"},{"journal-title":"TFT LCD Business Cycles and Trends","year":"2005","key":"2"},{"key":"1","first-page":"39","article-title":"The business of displays","author":"barnes","year":"2006","journal-title":"Information Display"},{"key":"10","doi-asserted-by":"crossref","first-page":"999","DOI":"10.1007\/BFb0020283","article-title":"Predicting time series with support vector machines","author":"mueller","year":"1997","journal-title":"Lecture Notes in Computer Science"},{"key":"7","article-title":"An inspection system for measuring luminance and uniformity of large-sclae backlight units based on area CCD","author":"wei","year":"2006","journal-title":"AOI Forum & Show 2006"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1063\/1.2813899"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1117\/1.2430501"},{"key":"4","article-title":"Review and forecast of the global backlight module industry","author":"chang","year":"2006","journal-title":"Indusrial Economics and Knowledge Center Report"},{"key":"9","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1109\/NNSP.1997.622433","article-title":"Nonlinear prediction of chaotic time series using support vector machines","author":"mukherjee","year":"1997","journal-title":"Proceedings of the 1997 IEEE Signal Processing Society Workshop"},{"key":"8","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-84996-098-4","author":"abe","year":"2010","journal-title":"Support Vector Machines for Pattern Classification"}],"event":{"name":"2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2013,5,6]]},"location":"Minneapolis, MN, USA","end":{"date-parts":[[2013,5,9]]}},"container-title":["2013 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6548505\/6555364\/06555731.pdf?arnumber=6555731","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T12:49:44Z","timestamp":1498049384000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6555731\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2013.6555731","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}