{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T19:42:17Z","timestamp":1729626137446,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/i2mtc.2014.6860742","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T21:02:35Z","timestamp":1406667755000},"page":"230-233","source":"Crossref","is-referenced-by-count":1,"title":["Measurement imperfections impact on the performance of digitally predistorted power amplifiers"],"prefix":"10.1109","author":[{"given":"Tingxiao","family":"Yang","sequence":"first","affiliation":[]},{"given":"Efrain","family":"Zenteno","sequence":"additional","affiliation":[]},{"given":"Niclas","family":"Bjorsell","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","year":"2010","key":"3"},{"journal-title":"Implementing A cdc7005 Low Jitter Clock Solution for High-Speed High-IF Adc Devices","year":"2004","author":"hoppenstein","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/PIMRC.2005.1651863"},{"journal-title":"Behavioral Modeling of Wireless Transmitters for Distortion Mitigation","year":"2012","author":"soltani tehrani","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/Swe-CTW.2012.6376285"},{"key":"5","doi-asserted-by":"crossref","first-page":"39","DOI":"10.1109\/MIM.2006.1708350","article-title":"Adc testing","volume":"9","author":"linnenbrink","year":"2006","journal-title":"IEEE Instrumentation & Measurement Magazine"},{"journal-title":"Understanding and Characterizing Timing Jitter","year":"2013","key":"4"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2005.860500"}],"event":{"name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2014,5,12]]},"location":"Montevideo, Uruguay","end":{"date-parts":[[2014,5,15]]}},"container-title":["2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6845396\/6860504\/06860742.pdf?arnumber=6860742","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,31]],"date-time":"2024-05-31T16:02:48Z","timestamp":1717171368000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6860742\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2014.6860742","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}