{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:13:16Z","timestamp":1730225596557,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/i2mtc.2014.6860854","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T17:02:35Z","timestamp":1406653355000},"page":"806-811","source":"Crossref","is-referenced-by-count":0,"title":["Optical properties of thin VO<inf>2<\/inf>-films at the phase transition: Design aspects for a fiber-optic thermometer"],"prefix":"10.1109","author":[{"given":"L. Hermano C.","family":"L.","sequence":"first","affiliation":[]},{"given":"A. M. N.","family":"Lima","sequence":"additional","affiliation":[]},{"given":"L. A. L.","family":"Almeida","sequence":"additional","affiliation":[]},{"given":"C. L.","family":"Ferreira","sequence":"additional","affiliation":[]},{"given":"H.","family":"Neff","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2005.03.063"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1063\/1.121999"},{"journal-title":"Abnt-NBR 5416-Application of Loads in Power Transformers-Procedure","year":"1997","key":"10"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1103\/RevModPhys.70.1039"},{"journal-title":"Mathematical Models of Hysteresis and Their Applications Elsevier Series in Electromagnetism","year":"2003","author":"mayergoyz","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/19.948321"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.70.161102"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200700251"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/20.43892"},{"key":"8","volume":"2","author":"heavens","year":"1964","journal-title":"Physics of Thin Films"}],"event":{"name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2014,5,12]]},"location":"Montevideo, Uruguay","end":{"date-parts":[[2014,5,15]]}},"container-title":["2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6845396\/6860504\/06860854.pdf?arnumber=6860854","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:04:01Z","timestamp":1490281441000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6860854\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2014.6860854","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}