{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:13:18Z","timestamp":1730225598609,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,5]]},"DOI":"10.1109\/i2mtc.2014.6860882","type":"proceedings-article","created":{"date-parts":[[2014,7,29]],"date-time":"2014-07-29T17:02:35Z","timestamp":1406653355000},"page":"945-948","source":"Crossref","is-referenced-by-count":5,"title":["Development of mechanical measurement system applied for electroplastic effect research"],"prefix":"10.1109","author":[{"given":"Xiaotao","family":"Han","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lantao","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangtao","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Binbin","family":"Ni","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinyu","family":"Duan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qi","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"909","article-title":"The electron retardation of dislocations in metals","volume":"21","author":"roshchupkin","year":"1979","journal-title":"Fiz Tverd Tela"},{"key":"2","first-page":"18","article-title":"Electromechanical effect in metals","volume":"10","author":"troitskii","year":"1969","journal-title":"Zh Eskp Teor Fiz"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/j.scriptamat.2009.04.006"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2006.01.029"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.52.15829"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-5093(00)00780-2"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/22\/12\/015"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/0036-9748(78)90026-1"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/S0921-5093(01)01122-4"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-998-0068-5"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/j.actamat.2010.09.009"}],"event":{"name":"2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2014,5,12]]},"location":"Montevideo, Uruguay","end":{"date-parts":[[2014,5,15]]}},"container-title":["2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6845396\/6860504\/06860882.pdf?arnumber=6860882","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:33:01Z","timestamp":1490283181000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6860882\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2014.6860882","relation":{},"subject":[],"published":{"date-parts":[[2014,5]]}}}