{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:50:58Z","timestamp":1725436258210},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151245","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"85-90","source":"Crossref","is-referenced-by-count":2,"title":["Impact of measurement setup and test load on the accuracy of harmonic current emission measurements"],"prefix":"10.1109","author":[{"given":"Ana-Maria","family":"Blanco","sequence":"first","affiliation":[]},{"given":"Ronny","family":"Gelleschus","sequence":"additional","affiliation":[]},{"given":"Jan","family":"Meyer","sequence":"additional","affiliation":[]},{"given":"Peter","family":"Schegner","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.2004.1350016"},{"journal-title":"Project IEC\/TR 61000–4-37 Ed 1 0 Electromagnetic compatibility - Calibration and verification protocol for harmonic emission compliance test systems","year":"0","key":"ref3"},{"journal-title":"Comparison measurement of various measurement systems - Round Robin test “Measurement uncertainty” of the DKE","year":"2013","key":"ref6"},{"key":"ref5","article-title":"DERlab round-robin testing of photovoltaic single-phase inverters","author":"perego","year":"2010","journal-title":"International Journal of Photovoltaics"},{"key":"ref8","article-title":"Impact of Supply Voltage Distortion on the Harmonic Emission of Electronic Household Equipment","author":"blanco","year":"2013","journal-title":"International VII Sympo-sium about Quality of the Electric Energy - SICEL"},{"article-title":"Steady State Load Models for Power System Analysis","year":"2009","author":"creswell","key":"ref7"},{"year":"2009","key":"ref2"},{"year":"2010","key":"ref1"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151245.pdf?arnumber=7151245","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T11:45:49Z","timestamp":1602675949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7151245"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151245","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}