{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T15:23:14Z","timestamp":1761578594978},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151250","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"115-120","source":"Crossref","is-referenced-by-count":5,"title":["Measurement of transient enclosure voltage in a 220kV gas insulated substation"],"prefix":"10.1109","author":[{"given":"Yuanji","family":"Cai","sequence":"first","affiliation":[]},{"given":"Yonggang","family":"Guan","sequence":"additional","affiliation":[]},{"given":"Weidong","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"8","article-title":"Researching the Efficiency of Measures for Decreasing the Transient Enclosure Voltage Rise of the Gas Insulated Switchgears","author":"bojic","year":"2001","journal-title":"Proc IPST"},{"key":"ref3","first-page":"71","article-title":"Investigation of Transient Phenomena in Inner and Outer Systems of GIS due to Disconnector Operation","author":"miri","year":"1995","journal-title":"Proc IPST"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.phpro.2012.05.114"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4591221"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2267781"},{"key":"ref7","first-page":"1","article-title":"Transient Enclosure Voltage (TEV) Measurement System of UHV GIS and TEV Statistical Characterization","author":"rong","year":"2011","journal-title":"Proc EMC Europe"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1982.317046"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1982.317033"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151250.pdf?arnumber=7151250","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T11:45:47Z","timestamp":1602675947000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7151250"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151250","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}