{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:49:14Z","timestamp":1725738554064},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151358","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T20:10:03Z","timestamp":1437163803000},"page":"728-733","source":"Crossref","is-referenced-by-count":6,"title":["Confocal displacement sensor with varifocal lens"],"prefix":"10.1109","author":[{"given":"Chun-Jen","family":"Weng","sequence":"first","affiliation":[]},{"given":"Tzu-Hsien","family":"Lan","sequence":"additional","affiliation":[]},{"given":"Chi-Hung","family":"Hwang","sequence":"additional","affiliation":[]},{"given":"Da-Ren","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Chih-Yen","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Pi-Ying","family":"Cheng","sequence":"additional","affiliation":[]},{"given":"Ken-Yuh","family":"Hsu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/MEMSYS.2005.1453908"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/I2MTC.2012.6229131"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/ICC.2006.254895"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/j.aca.2007.01.058"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1108\/02602281211233223"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1364\/OE.21.027611"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/ICMECH.2006.252516"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/Transducers.2013.6627065"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/IROS.2009.5354351"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ICoOM.2012.6316311"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1364\/OE.22.006025"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1088\/0957-0233\/9\/7\/023"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1117\/1.602260"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151358.pdf?arnumber=7151358","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:39:43Z","timestamp":1490387983000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151358\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151358","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}