{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,24]],"date-time":"2026-09-24T07:53:38Z","timestamp":1790236418263,"version":"4.1.0"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151359","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"734-738","source":"Crossref","is-referenced-by-count":3,"title":["Design and characterization of a measurement system for dielectric spectroscopy investigations on granular materials in the 2.45 GHz ISM band"],"prefix":"10.1109","author":[{"given":"E.","family":"Piuzzi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Chicarella","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.","family":"Frezza","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Pisa","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"S.","family":"Prontera","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"F.","family":"Timpani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"G.","family":"Cannazza","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"A.","family":"Cataldo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"E.","family":"De Benedetto","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","author":"marcuvitz","year":"1951","journal-title":"Waveguide Handbook"},{"key":"ref11","first-page":"1287","article-title":"Applying Error Correction to Network Analyzer Measurements","year":"2002","journal-title":"Application Note"},{"key":"ref12","year":"2011"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1970.4313932"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1974.9382"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/22.57336"},{"key":"ref16","year":"0","journal-title":"Agilent 85071E materials measurement software Technical overview"},{"key":"ref17","article-title":"Tables of the Complex Permittivity of Dielectric Reference Liquids at Frequencies up to 5 GHz","volume":"23","author":"gregory","year":"2012","journal-title":"Nat Phys Lab Teddington U K Report MAT"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"381","DOI":"10.1080\/00222739.1974.11688936","article-title":"Asphalt road maintenance with a mobile microwave power unit","volume":"9","author":"bosisio","year":"1974","journal-title":"Journal of Microwave Power"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1984.1132831"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1980.4314902"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/17\/8\/026"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/1029843021000041140"},{"key":"ref7","article-title":"Transmission\/reflection and short-circuit line methods for measuring permittivity and permeability","volume":"1355","author":"baker-jarvis","year":"1992","journal-title":"NIST Technical Note"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfoodeng.2012.04.012"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236791"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-947X(1999)125:4(347)"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Pisa, Italy","start":{"date-parts":[[2015,5,11]]},"end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151359.pdf?arnumber=7151359","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,28]],"date-time":"2019-08-28T06:46:28Z","timestamp":1566974788000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151359\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151359","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}