{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T18:14:52Z","timestamp":1725387292439},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151375","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T20:10:03Z","timestamp":1437163803000},"page":"824-829","source":"Crossref","is-referenced-by-count":1,"title":["Estimation of the apparent power by products of the DFT coefficients using maximum sidelobe decay Rife-Vincent windows"],"prefix":"10.1109","author":[{"given":"Jalen","family":"Stremfelj","sequence":"first","affiliation":[]},{"given":"Dusan","family":"Agrez","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2010.528539"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2014.6898396"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236777"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/19.31004"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.894189"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2008.08.006"},{"key":"ref16","first-page":"6","article-title":"Apparent power estimation by interpolation of the product of the DFT coefficients","author":"stremfelj","year":"2012","journal-title":"Proc IMEKO World Congr X"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1978.10837"},{"year":"2010","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/78.611203"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2478\/v10178-011-0001-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908625"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/61.796235"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.12.005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/78.558515"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/19.982947"},{"year":"2002","key":"ref2"},{"year":"2010","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.997826"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151375.pdf?arnumber=7151375","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:57:10Z","timestamp":1490389030000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151375\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151375","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}