{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:01:47Z","timestamp":1766066507805,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151396","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T20:10:03Z","timestamp":1437163803000},"page":"940-944","source":"Crossref","is-referenced-by-count":2,"title":["ECT image analysis applying an inverse problem algorithm with Tikhonov\/TV Regularization"],"prefix":"10.1109","author":[{"given":"Dario","family":"Pasadas","sequence":"first","affiliation":[]},{"given":"A. Lopes","family":"Ribeiro","sequence":"additional","affiliation":[]},{"given":"Helena","family":"Ramos","sequence":"additional","affiliation":[]},{"given":"Tiago","family":"Rocha","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2008.4547270"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2004.07.051"},{"key":"ref12","article-title":"Magnetoresistive sensors for nondestructive evaluation","author":"jander","year":"2005","journal-title":"Proceedings SPIE The Internat Society For Optical Engineering conference n&#x00B0; 5770"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.06.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0953-2048\/16\/12\/014"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2247713"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"2525","DOI":"10.3390\/s110302525","article-title":"Non-Destructive Techniques Based on Eddy Current Testing","volume":"11","author":"martin","year":"2011","journal-title":"SENSORS"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2006.328502"},{"key":"ref18","first-page":"1314","article-title":"Inversion of Eddy Current NDE Signals Using Artificial Neural Network Based Forward Model and Particle Swarm Optimization Algorithm","author":"zhang","year":"2009","journal-title":"International Conference on Information and Automation"},{"key":"ref19","doi-asserted-by":"crossref","DOI":"10.1887\/0750304359","author":"bertero","year":"1998","journal-title":"Inverse Problems in Imaging"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2011.5944142"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"176","DOI":"10.1016\/j.ndteint.2009.10.010","article-title":"Pulsed eddy current technique for defect detection in aircraft riveted structures","volume":"43","author":"he","year":"2010","journal-title":"NDT & E International"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2008.09.006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.11.005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/20.767369"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.11.003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2005.10.005"},{"key":"ref1","article-title":"Nondestructive Evaluation: A Tool in Design","author":"bray","year":"1997","journal-title":"Manufacturing and Service"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2013.6555552"},{"key":"ref20","article-title":"A new twist: Two-step iterative shrinkage\/thresholding algorithms for image restoration","author":"dias","year":"2007","journal-title":"IEEE Trans on Image Processing"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151396.pdf?arnumber=7151396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,28]],"date-time":"2019-08-28T10:46:37Z","timestamp":1566989197000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151396","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}