{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:14:24Z","timestamp":1730225664151,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151399","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"957-962","source":"Crossref","is-referenced-by-count":0,"title":["State recognition of viscoelastic sandwich structures based on permutation entropy and generalized Chebyshev support vector machine"],"prefix":"10.1109","author":[{"given":"Jinxiu","family":"Qu","sequence":"first","affiliation":[]},{"given":"Zhousuo","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Xue","family":"Luo","sequence":"additional","affiliation":[]},{"given":"Bing","family":"Li","sequence":"additional","affiliation":[]},{"given":"Jinpeng","family":"Wen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","article-title":"State recognition of the viscoelastic sandwich structure based on adaptive redundant second generation wavelet packet transform, permutation entropy and wavelet support vector machine","volume":"23","author":"qu","year":"2013","journal-title":"Smart Mater Struct"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/1\/015003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1006\/acha.1996.0015"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.88.174102"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.10.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2006.02.009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2010.12.017"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2011.11.022"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ecolmodel.2004.04.003"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1177\/1475921710365419"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2013.04.015"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.advengsoft.2012.10.002"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151399.pdf?arnumber=7151399","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T16:39:48Z","timestamp":1490373588000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151399\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151399","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}