{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T13:19:36Z","timestamp":1725455976487},"reference-count":21,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151441","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"1189-1193","source":"Crossref","is-referenced-by-count":1,"title":["60 GHz active microscopy with a bow-tie antenna as near-field probe"],"prefix":"10.1109","author":[{"given":"Rachid","family":"Omarouayache","sequence":"first","affiliation":[]},{"given":"Laurent","family":"Chusseau","sequence":"additional","affiliation":[]},{"given":"Pierre","family":"Payet","sequence":"additional","affiliation":[]},{"given":"Jeremy","family":"Raoult","sequence":"additional","affiliation":[]},{"given":"Sylvie","family":"Jarrix","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/22.910553"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1646735"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2011.2167744"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/mop.25754"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.3236665"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S1044-5803(02)00277-2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/OE.14.002203"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2014.7004189"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.1978972"},{"year":"0","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511813535"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10762-011-9809-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0030-4018(89)90103-X"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/1350-4495(94)00066-T"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-28668-6_8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.118577"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1482150"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2013.2288711"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.116685"},{"year":"0","key":"ref20"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.120918"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151441.pdf?arnumber=7151441","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:15:19Z","timestamp":1490375719000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151441\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151441","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}