{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:54:58Z","timestamp":1725504898812},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151442","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"1194-1197","source":"Crossref","is-referenced-by-count":1,"title":["Full-span error calibration method for on-chip quadrature accuracy measurement"],"prefix":"10.1109","author":[{"given":"Ya-Wen","family":"Ou","sequence":"first","affiliation":[]},{"given":"Yin-Cheng","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Shuw-Guann","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Da-Chiang","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Hwann-Kaeo","family":"Chiou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2007.895718"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2006.890343"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.864120"},{"journal-title":"RF Microelectronics","year":"1998","author":"razavi","key":"ref5"},{"key":"ref8","first-page":"340","article-title":"High phase accuracy on-wafer measurement for quadrature voltage-controlled oscillator","author":"chang","year":"2007","journal-title":"Proc EuMC"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.2003526"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2006.885643"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2005.1517042"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151442.pdf?arnumber=7151442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T17:24:35Z","timestamp":1490376275000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151442","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}