{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:19:13Z","timestamp":1725427153778},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151486","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"1430-1433","source":"Crossref","is-referenced-by-count":6,"title":["Temperature-independent high-speed distributed voltage measurement using intensiometric FBG interrogation"],"prefix":"10.1109","author":[{"given":"Grzegorz","family":"Fusiek","sequence":"first","affiliation":[]},{"given":"Philip","family":"Orr","sequence":"additional","affiliation":[]},{"given":"Pawel","family":"Niewczas","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2011.6038941"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2011.6039775"},{"key":"ref10","first-page":"842","article-title":"WDM Filters For Silicon Photonics Transceivers","author":"horst","year":"2011","journal-title":"OECC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/1.1926947"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/IPNRA.2008.ITuA4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.851072"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/68.740716"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2012.0063"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2008.05.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2012.6238024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/8\/4\/002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2009.5282012"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151486.pdf?arnumber=7151486","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T16:39:51Z","timestamp":1490373591000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151486\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151486","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}