{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:15:11Z","timestamp":1725426911025},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151488","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T20:10:03Z","timestamp":1437163803000},"page":"1440-1445","source":"Crossref","is-referenced-by-count":0,"title":["Illuminance sensor for error correction of DC-DC converter tracking using Perturb and Observe algorithm"],"prefix":"10.1109","author":[{"given":"Jose Carlos","family":"de Oliveira Custodio","sequence":"first","affiliation":[]},{"given":"Cicero","family":"da Rocha Souto","sequence":"additional","affiliation":[]},{"given":"Priscilla K.","family":"Pontes de Melo","sequence":"additional","affiliation":[]},{"given":"Adriano N.","family":"Ramos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"1","article-title":"An improved and very efficient MPPT controller for PV systems subjected to rapidly varying atmospheric conditions and partial shading","author":"raza","year":"2009","journal-title":"Proc Australasian Univ Power Eng Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2005.10.023"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2012.2183578"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IAPEC.2011.5779863"},{"journal-title":"Vishay Semiconductors","article-title":"BPW34S Silicon PIN Photodiode datasheet","year":"2012","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/pip.459"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/41.925586"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151488.pdf?arnumber=7151488","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T20:52:57Z","timestamp":1490388777000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151488\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151488","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}