{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,25]],"date-time":"2025-06-25T20:05:29Z","timestamp":1750881929675},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151504","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T16:10:03Z","timestamp":1437149403000},"page":"1522-1526","source":"Crossref","is-referenced-by-count":3,"title":["A structural framework across strongly and weakly defined measurements"],"prefix":"10.1109","author":[{"given":"Luca","family":"Mari","sequence":"first","affiliation":[]},{"given":"Mark","family":"Wilson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Edition (2008 version with minor corrections) Joint Committee for Guides in Metrology 2012","article-title":"International Vocabulary of Metrology - Basic and general concepts and associated terms (VIM)","year":"2012","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1515\/CCLM.2010.325"},{"journal-title":"A Treatise on Electricity and Magnetism","year":"1873","author":"maxwell","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/31\/6\/001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2013.04.039"},{"journal-title":"The Logic of Modern Physics","year":"1927","author":"bridgman","key":"ref3"},{"journal-title":"The Structure of Scientific Revolutions","year":"1970","author":"kuhn","key":"ref6"},{"journal-title":"The scientific conception of the world","year":"1929","author":"circle","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1126\/science.103.2684.677"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193693"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2193695"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(03)00018-6"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1948.tb00917.x"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151504.pdf?arnumber=7151504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T16:20:45Z","timestamp":1490372445000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151504","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}