{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:35:51Z","timestamp":1729618551178,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,5]]},"DOI":"10.1109\/i2mtc.2015.7151592","type":"proceedings-article","created":{"date-parts":[[2015,7,17]],"date-time":"2015-07-17T20:10:03Z","timestamp":1437163803000},"page":"2015-2019","source":"Crossref","is-referenced-by-count":5,"title":["Time domain characterization of avalanche photo detectors for sub-ns optical pulses"],"prefix":"10.1109","author":[{"given":"Mikko","family":"Hintikka","sequence":"first","affiliation":[]},{"given":"Juha","family":"Kostamovaara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.2722028"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3807\/JOSK.2011.15.1.001"},{"key":"ref10","article-title":"Breakdown Phenomena in Semiconductors and Semiconductor Devices","author":"levinshtein","year":"2005","journal-title":"World Scientific"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/16.987107"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/55.225573"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2011.2170405"},{"key":"ref8","article-title":"A time-gated 4×128 SPAD array with a 512 channel flash 80ps-TDC for pulsed Raman spectroscopy","author":"nissinen","year":"2013","journal-title":"European Conf Circuit Theory and Design IEE"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"457","DOI":"10.1109\/TED.2007.910570","article-title":"Low-noise avalanche photodiode in standard 0.35-um CMOS technology","volume":"55","author":"pancheri","year":"2008","journal-title":"IEEE Transactions on Electronic Devices"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1976.6312331"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/0471726400"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/el.2010.2550"}],"event":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2015,5,11]]},"location":"Pisa, Italy","end":{"date-parts":[[2015,5,14]]}},"container-title":["2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7137253\/7151225\/07151592.pdf?arnumber=7151592","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T15:55:06Z","timestamp":1498233306000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7151592\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2015.7151592","relation":{},"subject":[],"published":{"date-parts":[[2015,5]]}}}