{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:43:27Z","timestamp":1729622607215,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520323","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A novel adapter for the accurate measurement of AMN input impedance"],"prefix":"10.1109","author":[{"given":"Pin Zhang","family":"Zhao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bo","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jia","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Yan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Impedance Measurement Handbook","year":"2003","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2012.6237901"},{"key":"ref6","first-page":"7","article-title":"Undesired Uncertainty in Conducted Full-Compliance Measurement: A Proposal for Verification of Conformity of LISN Parameters According to Requirements of CISPR16-1","volume":"1","author":"zuccato","year":"2001","journal-title":"IEEE International Symposium on EMC"},{"key":"ref5","first-page":"521","article-title":"Mains Simulation Network (LISN or AMN) Uncertainty - How Good are Your Conducted Emission Measurements","author":"bronaugh","year":"1999","journal-title":"14th International Zurich EMC Symposium on EMC"},{"key":"ref8","first-page":"10","article-title":"Calibration of Line Artificial-Mains Network","volume":"24","author":"fei","year":"2006","journal-title":"Metrology & Measurement Technique"},{"article-title":"Calibration and use of artificial mains networks and absorbing clamps (Application of transducers for CISPR based emissions measurements)","year":"1999","author":"williams","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2012.2196046"},{"key":"ref9","first-page":"64","article-title":"Calibration of Artificial Mains Network(AMN) Used in EMC Test","author":"yang-dong","year":"2009","journal-title":"Electronics Quality"},{"year":"0","key":"ref1","article-title":"Specification for radio disturbance and immunity measuring apparatus and methods. Part 1.2: Radio disturbance and immunity measuring apparatus-Ancillary equipment-Conducted disturbances"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520323.pdf?arnumber=7520323","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T16:10:35Z","timestamp":1475165435000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520323\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520323","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}