{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T06:58:44Z","timestamp":1769151524057,"version":"3.49.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520364","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Waveform reconstruction for recurrent non-uniform discrete-time sampling scheme: Discussion of its instability"],"prefix":"10.1109","author":[{"given":"Wei-Da","family":"Hao","sequence":"first","affiliation":[]},{"given":"Yih-Chuyn","family":"Jenq","sequence":"additional","affiliation":[]},{"given":"David H.","family":"Chiang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/29.1497"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/78.80909"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2014.2307433"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2257846"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2015.2415511"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/19.50419"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"338","DOI":"10.1080\/00029890.2007.11920421","article-title":"A Combinatorial Proof of Vandermonde's Determinant","volume":"114","author":"benjamin","year":"2007","journal-title":"American Mathematical Monthly"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/19.50419"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APSAR.2007.4418602"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2011.2177834"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCS.1977.1084284"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1956.1086325"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/19.6060"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/19.585419"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1985.1164714"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Taipei, Taiwan","start":{"date-parts":[[2016,5,23]]},"end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520364.pdf?arnumber=7520364","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,11]],"date-time":"2019-09-11T20:22:35Z","timestamp":1568233355000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520364\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520364","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}