{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T21:27:23Z","timestamp":1725571643184},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520372","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Measurements and characterization of air temperature sensors for weather stations"],"prefix":"10.1109","author":[{"given":"Marcantonio","family":"Catelani","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Ciani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roberto","family":"Scotto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrea","family":"Zanobini","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/MIM.2012.6174577"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/IMTC.2011.5944154"},{"year":"2015","journal-title":"HygroCiip 2 (HC2) Humidity Temperature Probes User Guide","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.measurement.2015.11.021"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/IMTC.2007.379288"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TIM.2014.2367772"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TIM.2014.2381352"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1016\/j.measurement.2015.08.027"},{"year":"2003","author":"doebelin","journal-title":"Measurement Systems Application and Design","key":"ref9"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/IMTC.2008.4547085"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520372.pdf?arnumber=7520372","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T16:11:09Z","timestamp":1475165469000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520372\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520372","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}