{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T05:40:08Z","timestamp":1725514808740},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520385","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Simulation study of electrodes optimization design of power density imaging"],"prefix":"10.1109","author":[{"given":"Chunqing","family":"Dou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanbin","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Feng","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/8\/084007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/080723521"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2013.7.353"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2140\/apde.2013.6.751"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/8\/084005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.70.329"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/S0041-624X(97)00113-3"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1111\/j.1749-6632.1999.tb09489.x"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/BF02344769"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0041-624X(00)00029-9"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1137\/080715123"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/42.97586"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/29\/6\/S04"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/12.532610"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2010.4.665"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1137\/070686408"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/28\/8\/084008"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/15\/2A\/001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/27\/5\/055013"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520385.pdf?arnumber=7520385","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,29]],"date-time":"2016-09-29T16:11:16Z","timestamp":1475165476000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520385\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520385","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}