{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,5]],"date-time":"2025-06-05T04:07:29Z","timestamp":1749096449212,"version":"3.41.0"},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520418","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Estimation of inner scattering parameters from coupled systems"],"prefix":"10.1109","author":[{"given":"M.","family":"Neumayer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Bretterklieber","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Fundamentals of Statistical Signal Processing Practical Algorithm Development","year":"2013","author":"kay","key":"ref4"},{"article-title":"Intelliserv handbook: Handling and best practice","year":"2013","author":"varco","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6860740"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1007\/b138659","volume":"160","author":"kaipio","year":"2005","journal-title":"Statistical and Computational Inverse Problems"},{"journal-title":"Differential evolution — a simple and efficient adaptive scheme for global optimization over continuous spaces","year":"1995","author":"storn","key":"ref7"},{"journal-title":"Microwave Engineering","year":"2004","author":"pozar","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/9781118391242"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520418.pdf?arnumber=7520418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,4]],"date-time":"2025-06-04T06:33:08Z","timestamp":1749018788000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520418","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}