{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T10:47:22Z","timestamp":1725706042343},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520425","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-5","source":"Crossref","is-referenced-by-count":5,"title":["Detection of crack in cement-based specimens using microwave imaging with the 3-axis scanning system"],"prefix":"10.1109","author":[{"given":"Sergey","family":"Kharkovsky","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paritosh","family":"Giri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2014.6861010"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.08.010"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/2\/308"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2006.870132"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.909497"},{"key":"ref15","first-page":"465","article-title":"Microwave imaging of composite materials using image processing","author":"hoshyar","year":"2015","journal-title":"Proc Intern Symp Anten Prop (ISAP2015)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-006-8734-0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2006.98"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2317295"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1111\/j.1460-2695.2008.01255.x"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2012.11.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2022380"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s00138-009-0189-8"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-8667.2011.00716.x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.926396"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520425.pdf?arnumber=7520425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T10:48:21Z","timestamp":1474886901000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520425","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}