{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T09:02:13Z","timestamp":1773738133609,"version":"3.50.1"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520465","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T18:33:39Z","timestamp":1469644419000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["Multi-sensor data fusion for improved measurement accuracy in injection molding"],"prefix":"10.1109","author":[{"given":"Zhaoyan","family":"Fan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert X.","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Peng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"David O.","family":"Kazmer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2014.03.106"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2013.10.002"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2307\/2348005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2009.09.008"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2014.03.041"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0007-8506(07)61012-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.834070"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2010.05.010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2166383"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/cem.2638"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/62.821657"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Taipei, Taiwan","start":{"date-parts":[[2016,5,23]]},"end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520465.pdf?arnumber=7520465","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T14:48:36Z","timestamp":1474901316000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520465\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520465","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}