{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T00:44:07Z","timestamp":1725583447793},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/i2mtc.2016.7520494","type":"proceedings-article","created":{"date-parts":[[2016,7,27]],"date-time":"2016-07-27T14:33:39Z","timestamp":1469630019000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["A proposal for DSO bandwidth extension through synchronous time interleaving"],"prefix":"10.1109","author":[{"given":"Massimo","family":"D'Apuzzo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mauro","family":"D'Arco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michele","family":"Vadursi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2014.2365717"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2014.6981299"},{"journal-title":"Tektronix DPO70000 Series Datasheet — Scalable Performance Oscilloscopes","year":"2015","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2278564"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2433472"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/4\/045102"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2202188"},{"journal-title":"Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing","year":"2012","author":"knierim","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2249176"},{"journal-title":"Techniques for extending real-time oscilloscope bandwidth","year":"2015","key":"ref1"}],"event":{"name":"2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2016,5,23]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2016,5,26]]}},"container-title":["2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7508333\/7520318\/07520494.pdf?arnumber=7520494","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,9,26]],"date-time":"2016-09-26T10:48:45Z","timestamp":1474886925000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7520494\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/i2mtc.2016.7520494","relation":{},"subject":[],"published":{"date-parts":[[2016,5]]}}}